Nikon OST - 3000 / 12" Wafer Inspection

Simpie and speedy manual visual inspection of 300mm wafers. Contributes to dramatic increases in yields as an inline inspection system and analysis tool for backend process

Nikon OST - 3000 / 12" Wafer Inspection

Simpie and speedy manual visual inspection of 300mm wafers.Contributes to dramatic increases in yields as an inline inspection system and analysis tool for backend process.

• budget tool.
• Available for 8" and 12" wafer inspection.
• High resolution wafer surface and backside macro capture function.
• FOUP/FOSB handle.
• Large area and high brightness macro illuminator.
• available for Z axis measurement（bump height,particle height…..）.
• 5 million pixes digital CCD camera with measurement software.

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服務據點

台北總公司

105台北市松山區南京東路三段272號8樓

Tel：(02) 2740-3366

Fax：(02) 2773-5577

新竹分公司

300新竹市東區關新路27號15樓之2

Tel：(03) 564-1360

Fax：(03) 564-1363

台中分公司

406台中市北屯區文心路四段450號

Tel：(04) 2230-0077

Fax：(04) 2230-0055

台南分公司

744台南市新市區光明街82號

Tel：(06) 589-1721

Fax：(06) 589-1728

高雄分公司

806高雄市前鎮區民權二路8號12樓之2

Tel：(07) 537-3990

Fax：(07) 537-3880