Nikon Auto wafer warpage and die shift measuring system

Excellent auto loading system Integrated Nikon high accurancy measurement system ,Achievement ultra wafer loading and measuring

Available for customize auto loading system

Overview

‧Available for 12" and 8" wafer warpage and die shift measurement by fully auto 
‧Available for resin wafer (eWLB) glass wafer and ultra wapage wafer loading and measuring 
‧Maxima wafer wapage tolerance 8" +/- 2000um;12" +/- 4mm 
‧Enclosure with FFU,SECS/GEM,Wafer OCR are available for option 
‧3 type magnification selectable



聯絡我們


*驗證碼:
* 必填欄位
台北總公司 新竹分公司 台中分公司 台南分公司 高雄分公司