Nikon OST - 3100 / 12" Wafer Inspection
Nikon OST - 3100 / 12" Wafer Inspection
Nikon OST3100 /12" Wafer Inspection .The OST3100 is suitable for bumping house ,testing house,OQA department.Thanks for multi-function design and customers' co-work

Nikon OST - 3100 / 12" Wafer Inspection

Nikon OST - 3100 / 12" Wafer Inspection
The OST3100 is suitable for bumping house,testing house,OQA department.Thanks for multi - function design and customers' co - work.
Nikon OST - 3100 / 12" Wafer Inspection
• Available for 8" and 12" wafer inspection.
• Enable bending wafer and Thin wafer macro and micro inspection.
• High resolution wafer surface and backside macro capture function.
• KLARF file review software is available.
• IDM software enable to testing process for good die and bad die inspection.
• FOUP / FOSB handle.
• Auto focus and motorized stage.
• Large area and high brightness macro illuminator.
服務據點
台北總公司
105台北市松山區南京東路三段272號8樓
Tel:(02) 2740-3366
Fax:(02) 2773-5577
新竹分公司
300新竹市東區關新路27號15樓之2
Tel:(03) 564-1360
Fax:(03) 564-1363
台中分公司
406台中市北屯區文心路四段450號
Tel:(04) 2230-0077
Fax:(04) 2230-0055
台南分公司
744台南市新市區光明街82號
Tel:(06) 589-1721
Fax:(06) 589-1728
高雄分公司
806高雄市前鎮區民權二路8號12樓之2
Tel:(07) 537-3990
Fax:(07) 537-3880