Nikon NWL - 200 / 8" 6" Wafer Inspection
Nikon NWL - 200 / 8" 6" Wafer Inspection
Nikon’s outstanding proprietary technology makes the NWL200 Series the first lineup of wafer loaders for inspection microscopes capable of loading 100μm thin wafers(Bare wafer) . The NWL200 Series achieves highly reliable loading suitable for inspection o

Nikon NWL - 200 / 8" 6" Wafer Inspection  

Nikon NWL - 200 / 8" 6" Wafer Inspection
Nikon’s outstanding proprietary technology makes the NWL - 200 Series the first lineup of wafer loaders for inspection microscopes capable of loading 100μm thin wafers(Bare wafer). The NWL - 200 Series achieves highly reliable loading suitable for inspection of next-generation semiconductors.
Nikon NWL - 200 / 8" 6" Wafer Inspection
• Available for 5"",6"",8"" wafer inspection by different recipe(5"" Option).
• Edge - chipping detection With high - precision automatic detection,edge defects that cause wafer cracking can be removed promptly(Option)from its slot with a single button.
•  
3 kind macro inspection:wafer surface,wafer backside center and wafer backside periphery.
• The new WIL - LED illumination system enables more uniform illumination over a wider area C.O.O. almost zero.
• High reliability Should an error occur,an error message is displayed on the LCD panel.Even when the power is turned off,the vacuum chuck of the macro inspection mechanism stays on.If a problem occurs,wafers on the loader can be returned to the carrier without the use of tweezers.

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