The XT V 130C is a highly flexible and cost-effective electronics and semiconductor inspection system.

XT V 160 專為生產線和故障分析實驗室而設計。使用精密操縱桿，系統使用者可控制 5 軸移動載物平台。即時X射線使他們能夠直覺式地瀏覽複雜的印刷電路板和電子元件，並快速跟蹤缺陷。在自動檢測模式下，可以以最高流通量來檢測樣品。

Nikon XT H 160 XT H 225 The versatile XT H 225 system offers a powerful microfocus X-ray source, a large inspection volume, high image resolution and is ready for ultrafast CT reconstruction. They cover a wide range of applications,

Nikon XT H 450 The XT H 450 system offers the necessary source power to penetrate through high density parts and generate a scatter-free CT volume with micron accuracy.

Nikon MCT225 根據最新行業標準，提供適用於各種尺寸和材料密度的樣品計量 CT，無論內部和外部幾何形狀，均可在保持樣品完整性下觀察及直接測量，匯出易於理解的檢測報告，並降低開發過程的校正週期。